A Spark of Intelligence: General Industry Coverage

General Manufacturing Discussion

Contributor ·

EDM cutting conditions change throughout the cutting process as the part thickness and the level of dielectric contamination fluctuates. This article describes an experimental setup that can monitor these fluctuations and adjust the EDM's settings to maintain an optimal spark.

Imported from the CTE archive to seed discussion on MFGAxis.
Originally published on CTE: 1996-04-01
CTE source: https://ctemag.com/articles/spark-intelligence/
Legacy path: /articles/spark-intelligence

No published replies yet.

Sign in with innoNET to contribute