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Overcoming metrology bottlenecks in additive manufacturing

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Of unique importance today is the role of post-process metrology to validate the integrity of AM builds. One specific reason for this importance is that many parts produced by AM end up in safety critical applications where end-use functionality is of vital importance. The nature and relative roughness of AM surfaces, whether analyzing individual layers within a build, or the surface of a finished part render conventional metrology solutions somewhat impotent. In this article, I review developments from Zygo including work alongside Richard Leach that allow for hitherto unattainable metrology results, which are being used to enhance the use of AM as a production technology by making validation protocols more efficient.

Imported from the CTE archive to seed discussion on MFGAxis.
Originally published on CTE: 2020-03-12
CTE source: https://ctemag.com/news/overcoming-metrology-bottlenecks-additive-manufacturing/
Legacy path: /overcoming-metrology-bottlenecks-additive-manufacturing

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